The growing complexity and shrinking geometries of modern manufacturing
technologies are making high-density, low-voltage devices increasingly
susceptible to the influences of electrical noise, process variation,
transistor aging, and the effects of natural radiation. The system-level
impact of these errors can be far- reaching. Growing concern about
intermittent errors, unstable storage cells, and the effects of aging are
influencing system design, and failures in memories account for a significant
fraction of costly product returns. Emerging logic and memory device
technologies introduce several reliability challenges that need to be
addressed to make these technologies viable. Additionally, reliability is a
key issue for large-scale systems, such as those in data centers and cloud
computing infrastructure.