January 14, 2019
January 18, 2019
The 15th IEEE Workshop on Silicon Errors in Logic – System Effects
Stanford, Palo Alto, CA, USA
March 27 – March 28, 2019
The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and also for large scale servers and high-performance applications.
The SELSE workshop provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome.
We are happy to announce that selected SELSE papers will be included in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2019. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Portland, Oregon on June 24 – 27, 2019.
Key areas of interest include (but are not limited to):
– Error rates and trends in current and emerging technologies, including experimental failure data and the reliability characterization of deployed systems.
– New error mitigation techniques, robust software frameworks, and error handling protocols for resilient system design.
– Case studies analyzing the overhead, effectiveness, and design complexity of error mitigation techniques.
– Resilience characterization and strategies for machine learning applications, including autonomous vehicles.
– Resilience in new architectures, for example accelerator-rich systems and inexact or approximate computing.
– The design of resilient systems for space exploration.
– The interplay between system security issues and reliability.
Additional information and guidelines for submission are available at http://www.selse.org. Submissions and final papers should be PDF files following the IEEE two-column transactions format with six or fewer printed pages of text; the bibliography does not count against this page limit. Papers are not published through IEEE/ACM nor archived in the digital libraries; however, they are distributed to attendees of the workshop.