Reliability | SIGARCH

Silent Data Corruption at Scale

by Caroline Trippel on Aug 15, 2022 | Tags: Datacenters, Errors, Reliability, Testing

Hyperscalers are reporting frequent silent data corruptions (SDCs)—a.k.a. silent errors or corrupt execution errors (CEEs)—in their cloud fleets caused by silicon manufacturing defects. Notably, SDCs at-scale exhibit error occurrence rates on the order of one fault...

Building Fault-Tolerant Qubits Using More Physical States

by Yunong Shi, Chris Chamberland, Andrew Cross, and Fred Chong on Sep 23, 2019 | Tags: Quantum Computing, Reliability

Continuing with our thread on looking past abstractions in quantum computing, guest bloggers Yunong Shi from EPiQC and Christopher Chamberland and Andrew Cross from IBM examine how to make qubits fault tolerant by exploiting more of the physical state space available...

Computer Architecture Today

Silent Data Corruption at Scale

Building Fault-Tolerant Qubits Using More Physical States

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